Institute of High Performance Computing
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Research
Electronics & Photonics (EP)
Simulation for System-level Electronic Package (SSLEP) – An Efficient Tool for Power and Signal Integrity (PI/SI) Analysis in Advanced IC Package Team Members: Dr. LIU En-Xiao, Dr. WEI Xingchang, Dr. ZHANG Wenzu, and Dr. ZAW Zaw Oo ![]() Printed Circuit Board (PCB) interconnects
![]() IC packaging interconnects
Background: The trend of continuously lowering power supply voltage level and increasing signal switching speeds in advanced IC packages and printed circuit boards challenges market-available simulation tools for signal and power integrity (PI/SI) analysis of such complex geometry structures. A multilayer PCB or IC package can be considered as two functions parts: signal link path and power delivery network. A signal link path consists of traces and vias to set up a communication channel between drivers and receivers; usually pins of integrated circuits (IC), while a power delivery network usually contains a stack-up of power-ground planes, a large number of power-ground vias and many decoupling capacitors to provide an extremely low impedance path from voltage regulator module (VRM) to power-ground pins of IC blocks. Advanced Electronics and Electromagnetics (AEE) group @ IHPC has developed a broad range of the different methodologies to model the complex structures of advanced IC packages and PCBs, and integrated into a hybrid algorithm, namely Simulation for System-level Electronic Package (SSLEP), using to investigate the PI/SI of such system. Our group has also developed a user-friendly graphic user interface (GUI) for the algorithm to perform analysis simulations. SSLEP Applications:
SSLEP Advantages:
Example # 1: 4-ports PCB test board, four layers, two signal vias and three power-ground vias, radii of via & anti-pad (0.25 & 0.5 mm), board dimension (75 x 50 mm), total thickness (4 mm), and substrate material (er: 4.1, tan d: 0.23). Multilayer PCB with different via interconnects
Figs. 1.1, 1.2 & 1.3: Comparison of simulated results from SSLEP algorithm and full-wave FEM solver
Example # 2: Test PCB board with power and ground planes, total thickness (4 mm), and substrate material is FR-4 (er: 4.7, tan d: 0.2), SMT decoupling capacitor (lumped series {L, C, R} @ {1.57 nH, 8.14 nF, 666 mΩ}).
![]() Test PCB structure with an SMT decoupling capacitor in different locations
For location #1, closely spaced decoupling capacitor
For location #2, remotely spaced decoupling capacitor
Figs. 2.1 & 2.2: Comparison of simulated results with measured data
Benchmark simulations: design complexity vs. computing resources Memory usage & CPU time vs. number of vias in design structure
Memory usage & CPU time vs. number of layers in design structure
Graphic User Interface (GUI) for SSLEP
User Input Workspace
Import 3rd Party Design Layout
Visualized Simulation Results
Key Publications in Research Work
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This page is last updated at: 27-SEP-2012




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